5PXP
PanDDA analysis group deposition -- Crystal Structure of SP100 after initial refinement with no ligand modelled (structure 49)
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | DIAMOND BEAMLINE I04-1 |
| Synchrotron site | Diamond |
| Beamline | I04-1 |
| Temperature [K] | 100 |
| Detector technology | PIXEL |
| Collection date | 2015-04-02 |
| Detector | DECTRIS PILATUS 2M |
| Wavelength(s) | 0.9200 |
| Spacegroup name | C 1 2 1 |
| Unit cell lengths | 127.637, 45.361, 83.346 |
| Unit cell angles | 90.00, 102.18, 90.00 |
Refinement procedure
| Resolution | 28.450 - 1.860 |
| R-factor | 0.1702 |
| Rwork | 0.168 |
| R-free | 0.20920 |
| Structure solution method | FOURIER SYNTHESIS |
| Starting model (for MR) | 4ptb |
| RMSD bond length | 0.018 |
| RMSD bond angle | 1.711 |
| Data reduction software | XDS |
| Data scaling software | Aimless (0.3.11) |
| Phasing software | REFMAC |
| Refinement software | REFMAC (5.8.0135) |
Data quality characteristics
| Overall | Inner shell | Outer shell | |
| Low resolution limit [Å] | 28.450 | 28.450 | 1.910 |
| High resolution limit [Å] | 1.860 | 8.310 | 1.860 |
| Rmerge | 0.089 | 0.025 | 0.785 |
| Rmeas | 0.106 | 0.030 | 0.932 |
| Rpim | 0.057 | 0.016 | 0.496 |
| Total number of observations | 132289 | 1620 | 9577 |
| Number of reflections | 38770 | ||
| <I/σ(I)> | 11.5 | 50.6 | 1.7 |
| Completeness [%] | 97.9 | 96.5 | 97.3 |
| Redundancy | 3.4 | 3.4 | 3.4 |
| CC(1/2) | 0.997 | 0.999 | 0.446 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION, SITTING DROP | 7 | 277 | 0.1M MES pH 6.1 -- 20% PEG20K |
