5PXN
PanDDA analysis group deposition -- Crystal Structure of SP100 after initial refinement with no ligand modelled (structure 47)
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | DIAMOND BEAMLINE I04-1 |
| Synchrotron site | Diamond |
| Beamline | I04-1 |
| Temperature [K] | 100 |
| Detector technology | PIXEL |
| Collection date | 2015-04-02 |
| Detector | DECTRIS PILATUS 2M |
| Wavelength(s) | 0.9200 |
| Spacegroup name | C 1 2 1 |
| Unit cell lengths | 127.720, 45.410, 83.390 |
| Unit cell angles | 90.00, 102.12, 90.00 |
Refinement procedure
| Resolution | 36.740 - 1.430 |
| R-factor | 0.1792 |
| Rwork | 0.178 |
| R-free | 0.20570 |
| Structure solution method | FOURIER SYNTHESIS |
| Starting model (for MR) | 4ptb |
| RMSD bond length | 0.028 |
| RMSD bond angle | 2.306 |
| Data reduction software | XDS |
| Data scaling software | Aimless (0.3.11) |
| Phasing software | REFMAC |
| Refinement software | REFMAC (5.8.0135) |
Data quality characteristics
| Overall | Inner shell | Outer shell | |
| Low resolution limit [Å] | 36.740 | 36.740 | 1.470 |
| High resolution limit [Å] | 1.430 | 6.400 | 1.430 |
| Rmerge | 0.049 | 0.042 | 0.622 |
| Rmeas | 0.058 | 0.050 | 0.736 |
| Rpim | 0.031 | 0.026 | 0.388 |
| Total number of observations | 289829 | 3453 | 21279 |
| Number of reflections | 82933 | ||
| <I/σ(I)> | 14.2 | 37.6 | 2 |
| Completeness [%] | 96.1 | 96.9 | 95.9 |
| Redundancy | 3.5 | 3.5 | 3.5 |
| CC(1/2) | 0.998 | 0.995 | 0.726 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION, SITTING DROP | 7 | 277 | 0.1M MES pH 6.1 -- 20% PEG20K |
