5OXX
Crystal structure of NeqN/NeqC complex from Nanoarcheaum equitans at 1.7A
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | ALBA BEAMLINE XALOC |
| Synchrotron site | ALBA |
| Beamline | XALOC |
| Temperature [K] | 80 |
| Detector technology | PIXEL |
| Collection date | 2016-11-25 |
| Detector | DECTRIS PILATUS3 S 6M |
| Wavelength(s) | 0.9792 |
| Spacegroup name | P 4 21 2 |
| Unit cell lengths | 67.434, 67.434, 50.894 |
| Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
| Resolution | 50.890 - 1.740 |
| R-factor | 0.20735 |
| Rwork | 0.207 |
| R-free | 0.21884 |
| Structure solution method | MOLECULAR REPLACEMENT |
| Starting model (for MR) | 5oxw |
| RMSD bond length | 0.009 |
| RMSD bond angle | 1.375 |
| Data reduction software | XDS |
| Data scaling software | XDS |
| Phasing software | PHASER |
| Refinement software | REFMAC (5.8.0158) |
Data quality characteristics
| Overall | Outer shell | |
| Low resolution limit [Å] | 67.430 | 1.830 |
| High resolution limit [Å] | 1.740 | 1.740 |
| Rmerge | 0.057 | 0.949 |
| Rmeas | 0.062 | 1.027 |
| Rpim | 0.023 | 0.390 |
| Number of reflections | 12621 | 1803 |
| <I/σ(I)> | 22.8 | 2.7 |
| Completeness [%] | 100.0 | 100 |
| Redundancy | 12.5 | 12.9 |
| CC(1/2) | 0.999 | 0.904 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION, HANGING DROP | 293 | 30% PEG3350 0,2M Ammonium Nitrate pH6.3 |
