5O8A

Crystal Structure of rsEGFP2 in the non-fluorescent off-state determined by SFX

Experimental procedure

Experimental method	SINGLE WAVELENGTH
Source type	FREE ELECTRON LASER
Source details	SLAC LCLS BEAMLINE CXI
Synchrotron site	SLAC LCLS
Beamline	CXI
Temperature [K]	293
Detector technology	PIXEL
Collection date	2015-05-01
Detector	CS-PAD CXI-1
Wavelength(s)	1.3
Spacegroup name	P 21 21 21
Unit cell lengths	51.530, 62.850, 71.760
Unit cell angles	90.00, 90.00, 90.00

Refinement procedure

Resolution	17.251 - 1.700
R-factor	0.1529
Rwork	0.151
R-free	0.18380
Structure solution method	MOLECULAR REPLACEMENT
Starting model (for MR)	5dty
RMSD bond length	0.007
RMSD bond angle	0.963
Data reduction software	CrystFEL (0.6.1)
Data scaling software	CrystFEL (0.6.1)
Phasing software	PHASER
Refinement software	PHENIX ((1.10_2152: ???))

Data quality characteristics

	Overall
Low resolution limit [Å]	47.021
High resolution limit [Å]	1.700
Number of reflections	25880
<I/σ(I)>	11.5
Completeness [%]	99.8
Redundancy	665

Crystallization Conditions

crystal ID	method	pH	temperature	details
1	BATCH MODE	8	293	2 M ammonium sulphate, 20 mM NaCl, 120 mM HEPES