5K00
MELK in complex with NVS-MELK5
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | APS BEAMLINE 17-ID |
| Synchrotron site | APS |
| Beamline | 17-ID |
| Temperature [K] | 100 |
| Detector technology | PIXEL |
| Collection date | 2012-07-26 |
| Detector | DECTRIS PILATUS3 6M |
| Wavelength(s) | 1.00000 |
| Spacegroup name | P 21 21 21 |
| Unit cell lengths | 57.471, 67.403, 104.625 |
| Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
| Resolution | 17.840 - 1.770 |
| R-factor | 0.1753 |
| Rwork | 0.174 |
| R-free | 0.19550 |
| RMSD bond length | 0.009 |
| RMSD bond angle | 0.970 |
| Data reduction software | XDS |
| Data scaling software | SCALA (3.3.20) |
| Refinement software | BUSTER-TNT |
Data quality characteristics
| Overall | Inner shell | Outer shell | |
| Low resolution limit [Å] | 67.403 | 67.403 | 1.860 |
| High resolution limit [Å] | 1.768 | 5.590 | 1.770 |
| Rmerge | 0.027 | 0.504 | |
| Rmeas | 0.047 | ||
| Rpim | 0.020 | ||
| Total number of observations | 214197 | ||
| Number of reflections | 40469 | ||
| <I/σ(I)> | 20.8 | 18.6 | 1.5 |
| Completeness [%] | 99.9 | 99.7 | 99.9 |
| Redundancy | 5.3 | 4.8 | 4.7 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION, SITTING DROP | 294 | 100mM Hepes pH 7.6, 0.2M NaCl, 13.3% PEG 3350 |
