5JXR
Crystal structure of MtISWI
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | SSRF BEAMLINE BL17U |
| Synchrotron site | SSRF |
| Beamline | BL17U |
| Temperature [K] | 100 |
| Detector technology | CCD |
| Collection date | 2015-05-05 |
| Detector | ADSC QUANTUM 315r |
| Wavelength(s) | 0.987 |
| Spacegroup name | P 31 |
| Unit cell lengths | 127.767, 127.767, 106.666 |
| Unit cell angles | 90.00, 90.00, 120.00 |
Refinement procedure
| Resolution | 32.910 - 2.404 |
| R-factor | 0.1963 |
| Rwork | 0.195 |
| R-free | 0.22550 |
| Structure solution method | MOLECULAR REPLACEMENT |
| RMSD bond length | 0.004 |
| RMSD bond angle | 0.796 |
| Data reduction software | HKL-2000 (v705a) |
| Data scaling software | HKL-2000 (v705a) |
| Phasing software | PHASER (v7.0) |
| Refinement software | PHENIX (1.8.1_1168) |
Data quality characteristics
| Overall | |
| Low resolution limit [Å] | 50.000 |
| High resolution limit [Å] | 2.400 |
| Number of reflections | 75016 |
| <I/σ(I)> | 27 |
| Completeness [%] | 99.0 |
| Redundancy | 5.2 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | EVAPORATION | 277 | PEG3350,200 mM NaAc |
