5IH8

MELK in complex with NVS-MELK1

Experimental procedure

Experimental method	SINGLE WAVELENGTH
Source type	SYNCHROTRON
Source details	APS BEAMLINE 17-ID
Synchrotron site	APS
Beamline	17-ID
Temperature [K]	100
Detector technology	PIXEL
Collection date	2012-03-14
Detector	DECTRIS PILATUS 6M
Wavelength(s)	1.000000
Spacegroup name	P 21 21 21
Unit cell lengths	55.550, 67.360, 105.340
Unit cell angles	90.00, 90.00, 90.00

Refinement procedure

Resolution	25.050 - 1.850
R-factor	0.1777
Rwork	0.177
R-free	0.19950
RMSD bond length	0.010
RMSD bond angle	0.960
Data scaling software	XDS
Refinement software	BUSTER-TNT

Data quality characteristics

	Overall	Inner shell	Outer shell
Low resolution limit [Å]	39.696	39.696	1.950
High resolution limit [Å]	1.850	5.860	1.850
Rmerge		0.032	0.508
Number of reflections	34352
<I/σ(I)>	16.4	16	1.5
Completeness [%]	99.9	99.1	100
Redundancy	5.4	4.8	5.6

Crystallization Conditions

crystal ID	method	pH	temperature	details
1	VAPOR DIFFUSION, SITTING DROP		293	100mM Hepes pH 7.5, 0.2M sodium chloride, 25% PEG 3350