5H9V
Crystal structure of Regnase PIN domain, form I
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | PHOTON FACTORY BEAMLINE AR-NE3A |
Synchrotron site | Photon Factory |
Beamline | AR-NE3A |
Temperature [K] | 95 |
Detector technology | CCD |
Collection date | 2009-04-08 |
Detector | ADSC QUANTUM 270 |
Wavelength(s) | 0.97899, 0.97928, 0.96405 |
Spacegroup name | P 32 2 1 |
Unit cell lengths | 113.370, 113.370, 187.438 |
Unit cell angles | 90.00, 90.00, 120.00 |
Refinement procedure
Resolution | 47.490 - 2.750 |
R-factor | 0.1911 |
Rwork | 0.189 |
R-free | 0.22642 |
Structure solution method | MAD |
RMSD bond length | 0.014 |
RMSD bond angle | 1.726 |
Data reduction software | HKL-2000 |
Data scaling software | HKL-2000 |
Phasing software | SOLVE |
Refinement software | REFMAC (5.7.0032) |
Data quality characteristics
Overall | |
Low resolution limit [Å] | 47.490 |
High resolution limit [Å] | 2.750 |
Number of reflections | 33467 |
<I/σ(I)> | 22.2 |
Completeness [%] | 90.5 |
Redundancy | 7.9 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | VAPOR DIFFUSION, SITTING DROP | 5.5 | 293 | 1 M (NH4)2HPO4, 200 mM NaCl, 100 mM sodium citrate |