5H8W
XPD mechanism
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | DIAMOND BEAMLINE I03 |
| Synchrotron site | Diamond |
| Beamline | I03 |
| Temperature [K] | 100 |
| Detector technology | PIXEL |
| Collection date | 2013-12-01 |
| Detector | DECTRIS PILATUS 6M |
| Wavelength(s) | 0.987 |
| Spacegroup name | P 65 |
| Unit cell lengths | 78.569, 78.569, 177.832 |
| Unit cell angles | 90.00, 90.00, 120.00 |
Refinement procedure
| Resolution | 37.220 - 2.200 |
| R-factor | 0.20915 |
| Rwork | 0.207 |
| R-free | 0.24343 |
| RMSD bond length | 0.009 |
| RMSD bond angle | 1.467 |
| Data reduction software | xia2 |
| Data scaling software | xia2 |
| Phasing software | PHASER |
| Refinement software | REFMAC (5.8.0135) |
Data quality characteristics
| Overall | Outer shell | |
| Low resolution limit [Å] | 37.300 | 2.270 |
| High resolution limit [Å] | 2.200 | 2.200 |
| Rmerge | 0.088 | 0.679 |
| Number of reflections | 31168 | |
| <I/σ(I)> | 10.1 | 2.4 |
| Completeness [%] | 99.6 | 99.7 |
| Redundancy | 4 | 4 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION | 280.55 | PEG |
