5EBM

KcsA T75G mutant in the nonconductive state

Experimental procedure

Experimental method	SINGLE WAVELENGTH
Source type	SYNCHROTRON
Source details	ALS BEAMLINE 4.2.2
Synchrotron site	ALS
Beamline	4.2.2
Temperature [K]	80
Detector technology	CMOS
Collection date	2015-03-10
Detector	RDI CMOS_8M
Wavelength(s)	1.0
Spacegroup name	I 4
Unit cell lengths	155.720, 155.720, 75.556
Unit cell angles	90.00, 90.00, 90.00

Refinement procedure

Resolution	42.783 - 2.500
R-factor	0.2194
Rwork	0.216
R-free	0.25120
Structure solution method	MOLECULAR REPLACEMENT
Starting model (for MR)	1k4c
RMSD bond length	0.003
RMSD bond angle	0.582
Data reduction software	XDS
Data scaling software	XDS
Phasing software	PHASER
Refinement software	PHENIX (1.8_1069)

Data quality characteristics

	Overall	Inner shell	Outer shell
Low resolution limit [Å]	55.054	55.054	2.640
High resolution limit [Å]	2.500	7.910	2.500
Rmerge	0.085	0.027	1.124
Rmeas	0.092
Rpim	0.035	0.011	0.493
Total number of observations	219611	7405	28317
Number of reflections	31464
<I/σ(I)>	15.6	51.4	1.5
Completeness [%]	100.0	99.4	100
Redundancy	7	7.1	6.2

Crystallization Conditions

crystal ID	method	pH	temperature	details
1	VAPOR DIFFUSION, SITTING DROP		291	PEG 400