5DXT
p110alpha with GDC-0326
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | SLS BEAMLINE X06SA |
Synchrotron site | SLS |
Beamline | X06SA |
Temperature [K] | 100 |
Detector technology | PIXEL |
Collection date | 2010-12-13 |
Detector | DECTRIS PILATUS 6M |
Wavelength(s) | 0.99988 |
Spacegroup name | P 21 21 21 |
Unit cell lengths | 58.507, 133.672, 141.339 |
Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
Resolution | 97.120 - 2.250 |
R-factor | 0.22812 |
Rwork | 0.227 |
R-free | 0.26196 |
Structure solution method | MOLECULAR REPLACEMENT |
RMSD bond length | 0.009 |
RMSD bond angle | 1.051 |
Data reduction software | XDS |
Data scaling software | XSCALE |
Phasing software | MOLREP |
Refinement software | REFMAC (5.2.0005) |
Data quality characteristics
Overall | Outer shell | |
Low resolution limit [Å] | 97.120 | 2.330 |
High resolution limit [Å] | 2.250 | 2.250 |
Rmerge | 0.356 | |
Number of reflections | 51953 | |
<I/σ(I)> | 12.8 | 2.9 |
Completeness [%] | 96.8 | 97.6 |
Redundancy | 2.9 | 2.8 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | VAPOR DIFFUSION, HANGING DROP | 293 | PEG 20000 |