5CW4
Structure of CfBRCC36-CfKIAA0157 complex (Selenium Edge)
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | APS BEAMLINE 24-ID-C |
| Synchrotron site | APS |
| Beamline | 24-ID-C |
| Temperature [K] | 100 |
| Detector technology | PIXEL |
| Collection date | 2013-11-13 |
| Detector | DECTRIS PILATUS 6M-F |
| Wavelength(s) | 0.97920 |
| Spacegroup name | P 21 21 21 |
| Unit cell lengths | 50.106, 116.287, 231.538 |
| Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
| Resolution | 46.440 - 2.543 |
| R-factor | 0.1901 |
| Rwork | 0.189 |
| R-free | 0.24010 |
| Structure solution method | SAD |
| RMSD bond length | 0.003 |
| RMSD bond angle | 0.554 |
| Data scaling software | XDS |
| Refinement software | PHENIX |
Data quality characteristics
| Overall | Inner shell | Outer shell | |
| Low resolution limit [Å] | 46.440 | 11.370 | 2.610 |
| High resolution limit [Å] | 2.540 | 8.040 | 2.540 |
| Rmerge | 0.048 | 0.019 | 1.169 |
| Rmeas | 0.059 | 0.023 | 1.425 |
| Total number of observations | 243850 | ||
| Number of reflections | 84216 | 1736 | 6020 |
| <I/σ(I)> | 13.74 | 41.13 | 1.02 |
| Completeness [%] | 98.1 | 98.8 | 95 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION, SITTING DROP | 293 | 0.1 M Na HEPES (pH 7.0), 10% w/v PEG4000 and 10% (v/v) 2-propanol |






