5CE4
High Resolution X-Ray and Neutron diffraction structure of H-FABP
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | SLS BEAMLINE X06SA |
Synchrotron site | SLS |
Beamline | X06SA |
Temperature [K] | 293 |
Detector technology | PIXEL |
Collection date | 2012-06-07 |
Detector | PSI PILATUS 6M |
Wavelength(s) | 0.7085 |
Spacegroup name | P 21 21 21 |
Unit cell lengths | 34.588, 55.307, 71.185 |
Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
Resolution | 31.110 - 0.980 |
R-factor | 0.1404 |
Rwork | 0.139 |
R-free | 0.15920 |
RMSD bond length | 0.049 |
RMSD bond angle | 0.967 |
Data reduction software | HKL-2000 |
Data scaling software | HKL-2000 |
Phasing software | AMoRE |
Refinement software | PHENIX ((phenix.refine: dev_1796)) |
Data quality characteristics
Overall | Outer shell | |
Low resolution limit [Å] | 43.670 | 1.030 |
High resolution limit [Å] | 0.980 | 0.980 |
Number of reflections | 73795 | |
<I/σ(I)> | 6.8 | |
Completeness [%] | 93.5 | 92.6 |
Redundancy | 3.9 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | VAPOR DIFFUSION, SITTING DROP | 7.5 | 290 | 20mM Tris 22% PEG 4000 Heavy water |
1 | VAPOR DIFFUSION, SITTING DROP | 7.5 | 290 | 20mM Tris 22% PEG 4000 Heavy water |