5A30
Crystal structure of mtPAP N472D mutant in complex with ATPgammaS
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | SLS BEAMLINE X06DA |
| Synchrotron site | SLS |
| Beamline | X06DA |
| Temperature [K] | 287 |
| Detector technology | PIXEL |
| Detector | DECTRIS PILATUS 2M-F |
| Spacegroup name | P 21 21 21 |
| Unit cell lengths | 60.232, 95.220, 190.514 |
| Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
| Resolution | 39.750 - 2.750 |
| R-factor | 0.24894 |
| Rwork | 0.247 |
| R-free | 0.28716 |
| Structure solution method | MOLECULAR REPLACEMENT |
| Starting model (for MR) | NONE |
| RMSD bond length | 0.005 |
| RMSD bond angle | 0.976 |
| Phasing software | MOLREP |
| Refinement software | REFMAC (5.7.0032) |
Data quality characteristics
| Overall | Outer shell | |
| Low resolution limit [Å] | 40.000 | 2.900 |
| High resolution limit [Å] | 2.750 | 2.750 |
| Rmerge | 0.140 | |
| Number of reflections | 29303 | |
| <I/σ(I)> | 15 | 1.7 |
| Completeness [%] | 99.9 | 100 |
| Redundancy | 10 | 10.4 |
| CC(1/2) | 0.990 | 0.570 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 |
