4XOS
ANP32A LRR domain
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | ALBA BEAMLINE XALOC |
| Synchrotron site | ALBA |
| Beamline | XALOC |
| Temperature [K] | 100 |
| Detector technology | PIXEL |
| Collection date | 2014-06-15 |
| Detector | DECTRIS PILATUS 6M |
| Wavelength(s) | 0.97947 |
| Spacegroup name | P 1 21 1 |
| Unit cell lengths | 48.040, 50.880, 63.020 |
| Unit cell angles | 90.00, 110.19, 90.00 |
Refinement procedure
| Resolution | 45.088 - 1.559 |
| R-factor | 0.162 |
| Rwork | 0.160 |
| R-free | 0.19290 |
| Structure solution method | MOLECULAR REPLACEMENT |
| Starting model (for MR) | 2je0 |
| RMSD bond length | 0.007 |
| RMSD bond angle | 1.066 |
| Data reduction software | iMOSFLM |
| Data scaling software | SCALA |
| Phasing software | PHASER |
| Refinement software | PHENIX ((phenix.refine: 1.8.4_1496)) |
Data quality characteristics
| Overall | Outer shell | |
| Low resolution limit [Å] | 45.088 | 1.615 |
| High resolution limit [Å] | 1.559 | 1.559 |
| Rmerge | 0.072 | 0.498 |
| Number of reflections | 36978 | |
| <I/σ(I)> | 45.06 | 1.7 |
| Completeness [%] | 90.9 | 87.4 |
| Redundancy | 2 | 2 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION, SITTING DROP | 7.5 | 294 | 20% PEG3000, 0.1M Hepes pH 7.5, 0.2M NaCl |
