4WV4
Heterodimer of TAF8/TAF10
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | SOLEIL BEAMLINE PROXIMA 1 |
Synchrotron site | SOLEIL |
Beamline | PROXIMA 1 |
Temperature [K] | 100 |
Detector technology | PIXEL |
Collection date | 2012-01-28 |
Detector | DECTRIS PILATUS 6M |
Wavelength(s) | 0.98011 |
Spacegroup name | P 31 2 1 |
Unit cell lengths | 51.320, 51.320, 144.400 |
Unit cell angles | 90.00, 90.00, 120.00 |
Refinement procedure
Resolution | 44.444 - 1.909 |
R-factor | 0.2064 |
Rwork | 0.205 |
R-free | 0.23730 |
Structure solution method | SAD |
RMSD bond length | 0.003 |
RMSD bond angle | 0.681 |
Data reduction software | XDS |
Data scaling software | XSCALE |
Phasing software | PHASER |
Refinement software | PHENIX ((phenix.refine: 1.8.4_1496)) |
Data quality characteristics
Overall | Outer shell | |
Low resolution limit [Å] | 44.444 | 1.980 |
High resolution limit [Å] | 1.909 | 1.910 |
Rmerge | 0.029 | 0.880 |
Number of reflections | 16793 | |
<I/σ(I)> | 23.4 | 1.68 |
Completeness [%] | 93.9 | 58.53 |
Redundancy | 4.8 | 4.3 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | VAPOR DIFFUSION, SITTING DROP | 7.6 | 281.15 | sodium/potassium phosphate |