4R7D
Fab Hu 15C1
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | SLS BEAMLINE X06SA |
Synchrotron site | SLS |
Beamline | X06SA |
Temperature [K] | 100 |
Detector technology | PIXEL |
Collection date | 2013-12-08 |
Detector | PSI PILATUS 6M |
Wavelength(s) | 0.9764 |
Spacegroup name | P 1 21 1 |
Unit cell lengths | 101.820, 82.510, 261.570 |
Unit cell angles | 90.00, 101.21, 90.00 |
Refinement procedure
Resolution | 14.999 - 2.753 |
R-factor | 0.1779 |
Rwork | 0.177 |
R-free | 0.20900 |
Structure solution method | MOLECULAR REPLACEMENT |
RMSD bond length | 0.010 |
RMSD bond angle | 1.398 |
Data reduction software | XDS |
Data scaling software | XDS |
Phasing software | PHASER |
Refinement software | PHENIX ((phenix.refine: 1.8.1_1168)) |
Data quality characteristics
Overall | Outer shell | |
Low resolution limit [Å] | 50.000 | 2.820 |
High resolution limit [Å] | 2.750 | 2.750 |
Number of reflections | 109500 | |
<I/σ(I)> | 2.83 | |
Completeness [%] | 98.8 | 92.9 |
Redundancy | 3.2 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | VAPOR DIFFUSION, SITTING DROP | 7.3 | 291 | 20% PEG 3350, 0.1M HEPES pH 7.3, 0.2M ammonium formate, VAPOR DIFFUSION, SITTING DROP, temperature 291K |