4PDL
Structure of K+ selective NaK mutant in caesium
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | APS BEAMLINE 19-ID |
Synchrotron site | APS |
Beamline | 19-ID |
Temperature [K] | 78 |
Detector technology | CCD |
Collection date | 2009-06-09 |
Detector | ADSC QUANTUM 315r |
Wavelength(s) | 1.00 |
Spacegroup name | I 4 |
Unit cell lengths | 68.106, 68.106, 89.593 |
Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
Resolution | 34.053 - 1.700 |
R-factor | 0.2085 |
Rwork | 0.207 |
R-free | 0.23580 |
RMSD bond length | 0.008 |
RMSD bond angle | 1.082 |
Refinement software | PHENIX ((phenix.refine: 1.8.4_1496)) |
Data quality characteristics
Overall | |
Low resolution limit [Å] | 50.000 |
High resolution limit [Å] | 1.700 |
Number of reflections | 22437 |
<I/σ(I)> | 49.8 |
Completeness [%] | 99.9 |
Redundancy | 7.4 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | VAPOR DIFFUSION, SITTING DROP | 6.5 | 293 | 65% MPD, 100mM CsCl, 100mM MES, 4mM DM |