4OXW
X-ray structure of a designed CISK-PX domain
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | APS BEAMLINE 21-ID-G |
| Synchrotron site | APS |
| Beamline | 21-ID-G |
| Temperature [K] | 100 |
| Detector technology | CCD |
| Collection date | 2013-11-25 |
| Detector | MARMOSAIC 300 mm CCD |
| Wavelength(s) | 0.978 |
| Spacegroup name | P 21 21 21 |
| Unit cell lengths | 36.672, 49.258, 68.009 |
| Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
| Resolution | 39.890 - 1.730 |
| R-factor | 0.19426 |
| Rwork | 0.193 |
| R-free | 0.21861 |
| Structure solution method | MOLECULAR REPLACEMENT |
| Starting model (for MR) | 1xte |
| RMSD bond length | 0.012 |
| RMSD bond angle | 1.497 |
| Refinement software | REFMAC (5.7.0029) |
Data quality characteristics
| Overall | |
| Low resolution limit [Å] | 39.893 |
| High resolution limit [Å] | 1.730 |
| Number of reflections | 12689 |
| <I/σ(I)> | 57.75 |
| Completeness [%] | 99.2 |
| Redundancy | 12.2 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION, SITTING DROP | 295 | 0.2 M Ammonium Sulfate, 0.1 M Sodium Acetate pH 4.6, 30 %w/v Peg 2000 MME |






