4LVP
Crystal structure of IFT81 N-terminal domain
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | SLS BEAMLINE X10SA |
| Synchrotron site | SLS |
| Beamline | X10SA |
| Temperature [K] | 100 |
| Detector technology | PIXEL |
| Collection date | 2011-07-03 |
| Detector | DECTRIS PILATUS 6M |
| Wavelength(s) | 1.25450 |
| Spacegroup name | P 64 2 2 |
| Unit cell lengths | 76.066, 76.066, 94.063 |
| Unit cell angles | 90.00, 90.00, 120.00 |
Refinement procedure
| Resolution | 38.277 - 2.323 |
| R-factor | 0.2153 |
| Rwork | 0.214 |
| R-free | 0.23910 |
| Structure solution method | SAD |
| RMSD bond length | 0.009 |
| RMSD bond angle | 1.295 |
| Data reduction software | XDS |
| Data scaling software | XDS |
| Phasing software | PHENIX (Autosol) |
| Refinement software | PHENIX ((phenix.refine: 1.7.1_743)) |
Data quality characteristics
| Overall | Outer shell | |
| Low resolution limit [Å] | 38.277 | 2.470 |
| High resolution limit [Å] | 2.323 | 2.323 |
| Number of reflections | 13104 | |
| Completeness [%] | 99.9 | 99.6 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION, SITTING DROP | 8 | 291 | 0.8 M ammonium sulfate, 0.1 M Tris, VAPOR DIFFUSION, SITTING DROP, temperature 291K |
