4LVP

Crystal structure of IFT81 N-terminal domain

Experimental procedure

Experimental method	SINGLE WAVELENGTH
Source type	SYNCHROTRON
Source details	SLS BEAMLINE X10SA
Synchrotron site	SLS
Beamline	X10SA
Temperature [K]	100
Detector technology	PIXEL
Collection date	2011-07-03
Detector	DECTRIS PILATUS 6M
Wavelength(s)	1.25450
Spacegroup name	P 64 2 2
Unit cell lengths	76.066, 76.066, 94.063
Unit cell angles	90.00, 90.00, 120.00

Refinement procedure

Resolution	38.277 - 2.323
R-factor	0.2153
Rwork	0.214
R-free	0.23910
Structure solution method	SAD
RMSD bond length	0.009
RMSD bond angle	1.295
Data reduction software	XDS
Data scaling software	XDS
Phasing software	PHENIX (Autosol)
Refinement software	PHENIX ((phenix.refine: 1.7.1_743))

Data quality characteristics

	Overall	Outer shell
Low resolution limit [Å]	38.277	2.470
High resolution limit [Å]	2.323	2.323
Number of reflections	13104
Completeness [%]	99.9	99.6

Crystallization Conditions

crystal ID	method	pH	temperature	details
1	VAPOR DIFFUSION, SITTING DROP	8	291	0.8 M ammonium sulfate, 0.1 M Tris, VAPOR DIFFUSION, SITTING DROP, temperature 291K