4LPX
Crystal structure of TENCON variant D4
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | ROTATING ANODE |
Source details | RIGAKU MICROMAX-007 HF |
Temperature [K] | 95 |
Detector technology | CCD |
Collection date | 2010-03-17 |
Detector | RIGAKU SATURN 944 |
Wavelength(s) | 1.5418 |
Spacegroup name | P 41 3 2 |
Unit cell lengths | 100.630, 100.630, 100.630 |
Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
Resolution | 15.000 - 1.900 |
R-factor | 0.20929 |
Rwork | 0.208 |
R-free | 0.24167 |
Structure solution method | MOLECULAR REPLACEMENT |
Starting model (for MR) | 3tes |
RMSD bond length | 0.010 |
RMSD bond angle | 1.300 |
Data reduction software | XDS |
Data scaling software | XDS |
Phasing software | PHASER |
Refinement software | REFMAC (5.5.0109) |
Data quality characteristics
Overall | Outer shell | |
Low resolution limit [Å] | 30.000 | 1.970 |
High resolution limit [Å] | 1.900 | 1.900 |
Rmerge | 0.040 | 0.176 |
Number of reflections | 16040 | |
Completeness [%] | 96.3 | 90.2 |
Redundancy | 25.3 | 8.7 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | VAPOR DIFFUSION, SITTING DROP | 8.5 | 293 | 0.1 M Tris, pH 8.5, 1.5 M ammonium sulfate, 5% PEG400, VAPOR DIFFUSION, SITTING DROP, temperature 293K |