4LAV
Crystal Structure Analysis of FKBP52, Crystal Form II
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | SLS BEAMLINE X06SA |
| Synchrotron site | SLS |
| Beamline | X06SA |
| Temperature [K] | 100 |
| Detector technology | CCD |
| Collection date | 2006-02-18 |
| Detector | MARMOSAIC 225 mm CCD |
| Wavelength(s) | 0.9763 |
| Spacegroup name | P 1 21 1 |
| Unit cell lengths | 45.297, 125.801, 50.539 |
| Unit cell angles | 90.00, 92.01, 90.00 |
Refinement procedure
| Resolution | 20.000 - 1.800 |
| R-factor | 0.1922 |
| Rwork | 0.190 |
| R-free | 0.23500 |
| Structure solution method | MOLECULAR REPLACEMENT |
| Starting model (for MR) | 1q1c |
| RMSD bond length | 0.010 |
| RMSD bond angle | 1.274 |
| Data reduction software | MOSFLM |
| Data scaling software | SCALA (3.2.5) |
| Phasing software | MOLREP |
| Refinement software | REFMAC |
Data quality characteristics
| Overall | Inner shell | Outer shell | |
| Low resolution limit [Å] | 125.988 | 50.508 | 1.900 |
| High resolution limit [Å] | 1.800 | 5.690 | 1.800 |
| Rmerge | 0.080 | 0.070 | 0.346 |
| Total number of observations | 3405 | 15480 | |
| Number of reflections | 48008 | ||
| <I/σ(I)> | 8.6 | 6.8 | 2 |
| Completeness [%] | 92.1 | 83.6 | 94.6 |
| Redundancy | 2.2 | 2.4 | 2.2 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION | 8 | 293 | 2 M ammonium sulfate, 0.1 M Bis-Tris, pH 6.5, VAPOR DIFFUSION, temperature 293K |
