4KJS
Structure of native YfkE
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | SLS BEAMLINE X06SA |
Synchrotron site | SLS |
Beamline | X06SA |
Detector technology | PIXEL |
Detector | DECTRIS PILATUS 6M |
Wavelength(s) | 1.6 |
Spacegroup name | H 3 |
Unit cell lengths | 168.505, 168.505, 94.169 |
Unit cell angles | 90.00, 90.00, 120.00 |
Refinement procedure
Resolution | 50.010 - 3.050 |
R-factor | 0.21856 |
Rwork | 0.216 |
R-free | 0.26187 |
Structure solution method | MOLECULAR REPLACEMENT |
RMSD bond length | 0.008 |
RMSD bond angle | 1.266 |
Data reduction software | XDS |
Data scaling software | XDS |
Phasing software | PHASER |
Refinement software | REFMAC (5.6.0117) |
Data quality characteristics
Overall | |
Low resolution limit [Å] | 84.000 |
High resolution limit [Å] | 2.900 |
Number of reflections | 21979 |
Completeness [%] | 99.9 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | VAPOR DIFFUSION, SITTING DROP | 4 | 293 | 23-25% PEG400, 0.2M Ammonium Sulfate, 20mM NaCl, 0.1M NaAc pH4.0, 3% Hexanediol, VAPOR DIFFUSION, SITTING DROP, temperature 293K |