4JM4
Crystal Structure of PGT 135 Fab
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | APS BEAMLINE 23-ID-B |
Synchrotron site | APS |
Beamline | 23-ID-B |
Temperature [K] | 100 |
Detector technology | CCD |
Collection date | 2011-11-08 |
Detector | MARMOSAIC 300 mm CCD |
Wavelength(s) | 1.033 |
Spacegroup name | P 21 21 2 |
Unit cell lengths | 85.888, 138.150, 42.337 |
Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
Resolution | 31.407 - 1.751 |
R-factor | 0.2091 |
Rwork | 0.207 |
R-free | 0.24510 |
Structure solution method | MOLECULAR REPLACEMENT |
RMSD bond length | 0.006 |
RMSD bond angle | 1.112 |
Data reduction software | HKL-2000 |
Data scaling software | SCALEPACK |
Phasing software | PHASER |
Refinement software | PHENIX ((phenix.refine: 1.7.2_869)) |
Data quality characteristics
Overall | Outer shell | |
Low resolution limit [Å] | 31.407 | 1.780 |
High resolution limit [Å] | 1.750 | 1.750 |
Number of reflections | 49550 | |
<I/σ(I)> | 27.6 | 1.9 |
Completeness [%] | 96.1 | 73.8 |
Redundancy | 6.5 | 4 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | VAPOR DIFFUSION, SITTING DROP | 9.5 | 293 | 20% w/v PEG8000, 0.1 M CHES, pH 9.5, VAPOR DIFFUSION, SITTING DROP, temperature 293K |