4J09
Crystal Structure of LpxA bound to RJPXD33
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | APS BEAMLINE 21-ID-F |
| Synchrotron site | APS |
| Beamline | 21-ID-F |
| Temperature [K] | 100 |
| Detector technology | CCD |
| Collection date | 2011-04-26 |
| Detector | Marmosaic 300 |
| Wavelength(s) | 0.97872 |
| Spacegroup name | P 21 3 |
| Unit cell lengths | 96.399, 96.399, 96.399 |
| Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
| Resolution | 21.460 - 1.900 |
| R-factor | 0.1723 |
| Rwork | 0.172 |
| R-free | 0.17710 |
| Structure solution method | MOLECULAR REPLACEMENT |
| RMSD bond length | 0.011 |
| RMSD bond angle | 1.080 |
| Data reduction software | HKL-2000 |
| Data scaling software | HKL-2000 |
| Phasing software | PHASER |
| Refinement software | BUSTER-TNT (BUSTER 2.10.0) |
Data quality characteristics
| Overall | |
| Low resolution limit [Å] | 48.200 |
| High resolution limit [Å] | 1.900 |
| Number of reflections | 23751 |
| Completeness [%] | 99.7 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION | 6.5 | 293.15 | 1.4 M Potassium Phosphate, 33% DMSO, pH 6.5, VAPOR DIFFUSION, temperature 293.15K |






