4J09
Crystal Structure of LpxA bound to RJPXD33
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | APS BEAMLINE 21-ID-F |
Synchrotron site | APS |
Beamline | 21-ID-F |
Temperature [K] | 100 |
Detector technology | CCD |
Collection date | 2011-04-26 |
Detector | Marmosaic 300 |
Wavelength(s) | 0.97872 |
Spacegroup name | P 21 3 |
Unit cell lengths | 96.399, 96.399, 96.399 |
Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
Resolution | 21.460 - 1.900 |
R-factor | 0.1723 |
Rwork | 0.172 |
R-free | 0.17710 |
Structure solution method | MOLECULAR REPLACEMENT |
RMSD bond length | 0.011 |
RMSD bond angle | 1.080 |
Data reduction software | HKL-2000 |
Data scaling software | HKL-2000 |
Phasing software | PHASER |
Refinement software | BUSTER-TNT (BUSTER 2.10.0) |
Data quality characteristics
Overall | |
Low resolution limit [Å] | 48.200 |
High resolution limit [Å] | 1.900 |
Number of reflections | 23751 |
Completeness [%] | 99.7 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | VAPOR DIFFUSION | 6.5 | 293.15 | 1.4 M Potassium Phosphate, 33% DMSO, pH 6.5, VAPOR DIFFUSION, temperature 293.15K |