4IWX
Rimk structure at 2.85A
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | APS BEAMLINE 22-ID |
| Synchrotron site | APS |
| Beamline | 22-ID |
| Detector technology | CCD |
| Collection date | 2012-07-30 |
| Detector | MARMOSAIC 300 mm CCD |
| Wavelength(s) | 1.0 |
| Spacegroup name | P 64 2 2 |
| Unit cell lengths | 129.802, 129.802, 171.239 |
| Unit cell angles | 90.00, 90.00, 120.00 |
Refinement procedure
| Resolution | 46.986 - 2.854 |
| R-factor | 0.2181 |
| Rwork | 0.216 |
| R-free | 0.25650 |
| Structure solution method | MOLECULAR REPLACEMENT |
| Starting model (for MR) | 4iwy |
| RMSD bond length | 0.010 |
| RMSD bond angle | 1.475 |
| Data reduction software | DENZO |
| Data scaling software | SCALEPACK |
| Phasing software | SHELXS |
| Refinement software | PHENIX (1.8.1_1168) |
Data quality characteristics
| Overall | Inner shell | Outer shell | |
| Low resolution limit [Å] | 50.000 | 50.000 | 2.900 |
| High resolution limit [Å] | 2.850 | 7.730 | 2.850 |
| Rmerge | 0.111 | 0.053 | 0.639 |
| Number of reflections | 20166 | ||
| <I/σ(I)> | 7.4 | ||
| Completeness [%] | 98.7 | 99.5 | 88.7 |
| Redundancy | 15.7 | 14.4 | 8.4 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION, SITTING DROP | 7.5 | 291 | 100 mM HEPES, and 1.8 M ammonium sulfate , pH 7.5, VAPOR DIFFUSION, SITTING DROP, temperature 291K |






