4I6M
Structure of Arp7-Arp9-Snf2(HSA)-RTT102 subcomplex of SWI/SNF chromatin remodeler.
Experimental procedure
| Experimental method | MAD |
| Source type | SYNCHROTRON |
| Source details | NSLS BEAMLINE X25 |
| Synchrotron site | NSLS |
| Beamline | X25 |
| Temperature [K] | 100 |
| Detector technology | PIXEL |
| Collection date | 2010-11-08 |
| Detector | PSI PILATUS 6M |
| Wavelength(s) | 0.979, 1.1 |
| Spacegroup name | C 1 2 1 |
| Unit cell lengths | 227.374, 104.138, 81.319 |
| Unit cell angles | 90.00, 93.78, 90.00 |
Refinement procedure
| Resolution | 29.900 - 2.801 |
| R-factor | 0.1865 |
| Rwork | 0.184 |
| R-free | 0.22260 |
| Structure solution method | MAD |
| RMSD bond length | 0.009 |
| RMSD bond angle | 1.181 |
| Data reduction software | HKL-2000 |
| Data scaling software | HKL-2000 |
| Phasing software | SOLVE |
| Refinement software | PHENIX ((phenix.refine: 1.7.1_743)) |
Data quality characteristics
| Overall | Inner shell | Outer shell | |
| Low resolution limit [Å] | 29.900 | 4.780 | 2.860 |
| High resolution limit [Å] | 2.800 | 4.180 | 2.800 |
| Rmerge | 0.510 | 0.520 | 0.032 |
| Number of reflections | 46664 | ||
| <I/σ(I)> | 18.7 | 25.8 | 29.4 |
| Completeness [%] | 98.2 | 100 | 99.8 |
| Redundancy | 3.9 | 4.2 | 4.1 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION, SITTING DROP | 7.5 | 294 | 1.6 - 2.0 M Ammonium Phosphate, 0.1mM HEPES, pH 7.5, 1mM DTT, VAPOR DIFFUSION, SITTING DROP, temperature 294K |
