4HM7
Naphthalene 1,2-Dioxygenase bound to styrene
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | ALS BEAMLINE 4.2.2 |
| Synchrotron site | ALS |
| Beamline | 4.2.2 |
| Temperature [K] | 100 |
| Detector technology | CCD |
| Collection date | 2004-11-01 |
| Detector | NOIR-1 |
| Wavelength(s) | 1.04 |
| Spacegroup name | H 3 2 |
| Unit cell lengths | 139.835, 139.835, 208.029 |
| Unit cell angles | 90.00, 90.00, 120.00 |
Refinement procedure
| Resolution | 15.981 - 1.500 |
| R-factor | 0.1588 |
| Rwork | 0.157 |
| R-free | 0.19370 |
| Structure solution method | MOLECULAR REPLACEMENT |
| RMSD bond length | 0.006 |
| RMSD bond angle | 1.153 |
| Data reduction software | d*TREK (9.2LDz) |
| Data scaling software | d*TREK |
| Phasing software | AMoRE |
| Refinement software | PHENIX (1.8_1069) |
Data quality characteristics
| Overall | Inner shell | Outer shell | |
| Low resolution limit [Å] | 15.980 | 15.980 | 1.550 |
| High resolution limit [Å] | 1.500 | 3.220 | 1.500 |
| Rmerge | 0.057 | 0.026 | 0.436 |
| Total number of observations | 54785 | 30116 | |
| Number of reflections | 121577 | ||
| <I/σ(I)> | 12.6 | 39 | 2.7 |
| Completeness [%] | 97.8 | 98.4 | 84.5 |
| Redundancy | 4.07 | 4.3 | 2.88 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION | 5 | 279.15 | 1.9-2.2 M AMMONIUM SULFATE, 4-6%, DIOXANE, 0.1 M MES, pH 5.0, VAPOR DIFFUSION, temperature 279.15K |
| 1 | VAPOR DIFFUSION | 5 | 279.15 | 1.9-2.2 M AMMONIUM SULFATE, 4-6%, DIOXANE, 0.1 M MES, pH 5.0, VAPOR DIFFUSION, temperature 279.15K |






