4FZQ
Crystal structure of HP0197-G5
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | SSRF BEAMLINE BL17U |
Synchrotron site | SSRF |
Beamline | BL17U |
Temperature [K] | 298 |
Detector technology | IMAGE PLATE |
Collection date | 2010-05-10 |
Detector | MAR555 FLAT PANEL |
Wavelength(s) | 0.9792 |
Spacegroup name | P 41 2 2 |
Unit cell lengths | 114.592, 114.592, 128.545 |
Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
Resolution | 34.880 - 2.500 |
R-factor | 0.255 |
Rwork | 0.255 |
R-free | 0.27800 |
RMSD bond length | 0.007 |
RMSD bond angle | 1.500 |
Data reduction software | HKL-2000 |
Data scaling software | HKL-2000 |
Phasing software | PHENIX |
Refinement software | CNS (1.2) |
Data quality characteristics
Overall | Outer shell | |
Low resolution limit [Å] | 50.000 | 2.590 |
High resolution limit [Å] | 2.500 | 2.490 |
Number of reflections | 29561 | |
Completeness [%] | 86.2 | 91.5 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | VAPOR DIFFUSION | 4.5 | 293 | 38% MPD, 0.1M acetate pH 4.5, 0.1M NBSD-256, VAPOR DIFFUSION, temperature 293K |