4FZ4
Crystal structure of HP0197-18kd
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | SSRF BEAMLINE BL17U |
| Synchrotron site | SSRF |
| Beamline | BL17U |
| Temperature [K] | 298 |
| Detector technology | IMAGE PLATE |
| Collection date | 2008-11-20 |
| Detector | MAR555 FLAT PANEL |
| Wavelength(s) | 0.9795 |
| Spacegroup name | P 21 21 2 |
| Unit cell lengths | 49.235, 87.601, 38.540 |
| Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
| Resolution | 18.820 - 2.440 |
| R-factor | 0.222 |
| Rwork | 0.222 |
| R-free | 0.26300 |
| Structure solution method | SAD |
| RMSD bond length | 0.006 |
| RMSD bond angle | 1.100 |
| Data reduction software | HKL-2000 |
| Data scaling software | HKL-2000 |
| Phasing software | PHENIX |
| Refinement software | CNS (1.2) |
Data quality characteristics
| Overall | Outer shell | |
| Low resolution limit [Å] | 50.000 | 2.490 |
| High resolution limit [Å] | 2.440 | 2.400 |
| Number of reflections | 6551 | |
| Completeness [%] | 85.2 | 97.8 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | EVAPORATION | 7.5 | 293 | 30% PEG 3350, 0.4M NaNO3 , pH 7.5, EVAPORATION, temperature 293K |
