4BIW
Crystal structure of CpxAHDC (hexagonal form)
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | SOLEIL BEAMLINE PROXIMA 1 |
| Synchrotron site | SOLEIL |
| Beamline | PROXIMA 1 |
| Temperature [K] | 100 |
| Detector technology | PIXEL |
| Detector | DECTRIS PILATUS 6M |
| Spacegroup name | P 61 2 2 |
| Unit cell lengths | 144.303, 144.303, 250.483 |
| Unit cell angles | 90.00, 90.00, 120.00 |
Refinement procedure
| Resolution | 47.290 - 2.850 |
| R-factor | 0.208 |
| Rwork | 0.208 |
| R-free | 0.21330 |
| Structure solution method | SAD |
| Starting model (for MR) | NONE |
| RMSD bond length | 0.010 |
| RMSD bond angle | 1.160 |
| Data reduction software | XDS |
| Data scaling software | Aimless |
| Phasing software | PHENIX |
| Refinement software | BUSTER (2.10.0) |
Data quality characteristics
| Overall | Outer shell | |
| Low resolution limit [Å] | 47.290 | 2.990 |
| High resolution limit [Å] | 2.850 | 2.850 |
| Rmerge | 0.070 | 1.020 |
| Number of reflections | 35353 | |
| <I/σ(I)> | 18.4 | 2.1 |
| Completeness [%] | 97.1 | 98.3 |
| Redundancy | 11 | 11.5 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 |






