4BIW
Crystal structure of CpxAHDC (hexagonal form)
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | SOLEIL BEAMLINE PROXIMA 1 |
Synchrotron site | SOLEIL |
Beamline | PROXIMA 1 |
Temperature [K] | 100 |
Detector technology | PIXEL |
Detector | DECTRIS PILATUS 6M |
Spacegroup name | P 61 2 2 |
Unit cell lengths | 144.303, 144.303, 250.483 |
Unit cell angles | 90.00, 90.00, 120.00 |
Refinement procedure
Resolution | 47.290 - 2.850 |
R-factor | 0.208 |
Rwork | 0.208 |
R-free | 0.21330 |
Structure solution method | SAD |
Starting model (for MR) | NONE |
RMSD bond length | 0.010 |
RMSD bond angle | 1.160 |
Data reduction software | XDS |
Data scaling software | Aimless |
Phasing software | PHENIX |
Refinement software | BUSTER (2.10.0) |
Data quality characteristics
Overall | Outer shell | |
Low resolution limit [Å] | 47.290 | 2.990 |
High resolution limit [Å] | 2.850 | 2.850 |
Rmerge | 0.070 | 1.020 |
Number of reflections | 35353 | |
<I/σ(I)> | 18.4 | 2.1 |
Completeness [%] | 97.1 | 98.3 |
Redundancy | 11 | 11.5 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 |