3VL8
Crystal structure of XEG
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | ROTATING ANODE |
Source details | RIGAKU ULTRAX 18 |
Detector technology | IMAGE PLATE |
Collection date | 2009-08-04 |
Detector | RIGAKU RAXIS IV++ |
Wavelength(s) | 1.5418 |
Spacegroup name | P 65 |
Unit cell lengths | 92.999, 92.999, 61.955 |
Unit cell angles | 90.00, 90.00, 120.00 |
Refinement procedure
Resolution | 20.000 - 1.900 |
R-factor | 0.17344 |
Rwork | 0.172 |
R-free | 0.19848 |
Structure solution method | MOLECULAR REPLACEMENT |
Starting model (for MR) | 1oa2 |
RMSD bond length | 0.005 |
RMSD bond angle | 0.977 |
Refinement software | REFMAC (5.6.0117) |
Data quality characteristics
Overall | |
Low resolution limit [Å] | 50.000 |
High resolution limit [Å] | 1.900 |
Number of reflections | 24103 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 |