3VL8
Crystal structure of XEG
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | ROTATING ANODE |
| Source details | RIGAKU ULTRAX 18 |
| Detector technology | IMAGE PLATE |
| Collection date | 2009-08-04 |
| Detector | RIGAKU RAXIS IV++ |
| Wavelength(s) | 1.5418 |
| Spacegroup name | P 65 |
| Unit cell lengths | 92.999, 92.999, 61.955 |
| Unit cell angles | 90.00, 90.00, 120.00 |
Refinement procedure
| Resolution | 20.000 - 1.900 |
| R-factor | 0.17344 |
| Rwork | 0.172 |
| R-free | 0.19848 |
| Structure solution method | MOLECULAR REPLACEMENT |
| Starting model (for MR) | 1oa2 |
| RMSD bond length | 0.005 |
| RMSD bond angle | 0.977 |
| Refinement software | REFMAC (5.6.0117) |
Data quality characteristics
| Overall | |
| Low resolution limit [Å] | 50.000 |
| High resolution limit [Å] | 1.900 |
| Number of reflections | 24103 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 |
