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3TDX

Crystal structure of HSC L82V

Experimental procedure
Experimental methodSINGLE WAVELENGTH
Source typeSYNCHROTRON
Source detailsNSLS BEAMLINE X25
Synchrotron siteNSLS
BeamlineX25
Temperature [K]100
Detector technologyCCD
Collection date2011-04-11
DetectorADSC QUANTUM 315
Wavelength(s)0.975
Spacegroup nameP 21 21 21
Unit cell lengths99.012, 118.661, 151.343
Unit cell angles90.00, 90.00, 90.00
Refinement procedure
Resolution46.690 - 2.500
R-factor0.165
Rwork0.162
R-free0.20800
Structure solution methodMOLECULAR REPLACEMENT
Starting model (for MR)3kly
RMSD bond length0.007
RMSD bond angle0.996
Data reduction softwareDENZO
Data scaling softwareSCALEPACK
Refinement softwarePHENIX (1.7.1_743)
Data quality characteristics
 OverallInner shellOuter shell
Low resolution limit [Å]50.00050.0002.340
High resolution limit [Å]2.3006.2402.300
Rmerge0.1030.0390.707
Number of reflections77094
<I/σ(I)>7.1
Completeness [%]99.199.598.3
Redundancy8.58.78.1
Crystallization Conditions
crystal IDmethodpHtemperaturedetails
1VAPOR DIFFUSION7.5298PEG 400, pH 7.5, vapor diffusion, temperature 298K

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