3TDX
Crystal structure of HSC L82V
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | NSLS BEAMLINE X25 |
| Synchrotron site | NSLS |
| Beamline | X25 |
| Temperature [K] | 100 |
| Detector technology | CCD |
| Collection date | 2011-04-11 |
| Detector | ADSC QUANTUM 315 |
| Wavelength(s) | 0.975 |
| Spacegroup name | P 21 21 21 |
| Unit cell lengths | 99.012, 118.661, 151.343 |
| Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
| Resolution | 46.690 - 2.500 |
| R-factor | 0.165 |
| Rwork | 0.162 |
| R-free | 0.20800 |
| Structure solution method | MOLECULAR REPLACEMENT |
| Starting model (for MR) | 3kly |
| RMSD bond length | 0.007 |
| RMSD bond angle | 0.996 |
| Data reduction software | DENZO |
| Data scaling software | SCALEPACK |
| Refinement software | PHENIX (1.7.1_743) |
Data quality characteristics
| Overall | Inner shell | Outer shell | |
| Low resolution limit [Å] | 50.000 | 50.000 | 2.340 |
| High resolution limit [Å] | 2.300 | 6.240 | 2.300 |
| Rmerge | 0.103 | 0.039 | 0.707 |
| Number of reflections | 77094 | ||
| <I/σ(I)> | 7.1 | ||
| Completeness [%] | 99.1 | 99.5 | 98.3 |
| Redundancy | 8.5 | 8.7 | 8.1 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION | 7.5 | 298 | PEG 400, pH 7.5, vapor diffusion, temperature 298K |






