3IEG
Crystal Structure of P58(IPK) TPR Domain at 2.5 A
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | APS BEAMLINE 22-ID |
| Synchrotron site | APS |
| Beamline | 22-ID |
| Temperature [K] | 77 |
| Detector technology | CCD |
| Collection date | 2007-12-01 |
| Detector | MARMOSAIC 300 mm CCD |
| Wavelength(s) | 1.0 |
| Spacegroup name | P 1 21 1 |
| Unit cell lengths | 84.041, 93.186, 84.412 |
| Unit cell angles | 90.00, 119.50, 90.00 |
Refinement procedure
| Resolution | 39.280 - 2.510 |
| R-factor | 0.24703 |
| Rwork | 0.245 |
| R-free | 0.28435 |
| Structure solution method | SAD |
| RMSD bond length | 0.009 |
| RMSD bond angle | 1.115 |
| Data reduction software | HKL-2000 |
| Data scaling software | HKL-2000 |
| Phasing software | SOLVE |
| Refinement software | REFMAC (5.2.0019) |
Data quality characteristics
| Overall | |
| Low resolution limit [Å] | 50.000 |
| High resolution limit [Å] | 2.500 |
| Number of reflections | 32991 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION, HANGING DROP | 7 | 281 | 15% PEG 5000 MME, 100 mM Hepes pH 7.0, VAPOR DIFFUSION, HANGING DROP, temperature 281K |
