3FSN
Crystal structure of RPE65 at 2.14 angstrom resolution
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | APS BEAMLINE 23-ID-D |
Synchrotron site | APS |
Beamline | 23-ID-D |
Temperature [K] | 100 |
Detector technology | CCD |
Collection date | 2008-11-28 |
Detector | MARMOSAIC 300 mm CCD |
Wavelength(s) | 1.03324 |
Spacegroup name | P 65 |
Unit cell lengths | 176.516, 176.516, 86.862 |
Unit cell angles | 90.00, 90.00, 120.00 |
Refinement procedure
Resolution | 48.220 - 2.140 |
R-factor | 0.1816 |
Rwork | 0.180 |
R-free | 0.21635 |
Structure solution method | SAD |
RMSD bond length | 0.013 |
RMSD bond angle | 1.404 |
Data reduction software | HKL-2000 |
Data scaling software | HKL-2000 |
Phasing software | SHELXS |
Refinement software | REFMAC (5.2.0019) |
Data quality characteristics
Overall | Outer shell | |
Low resolution limit [Å] | 50.000 | 2.220 |
High resolution limit [Å] | 2.140 | 2.140 |
Number of reflections | 83509 | |
<I/σ(I)> | 14.2 | 2.16 |
Completeness [%] | 99.5 | 98.3 |
Redundancy | 6.3 | 5.7 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | VAPOR DIFFUSION, HANGING DROP | 6 | 281 | precipitant: PEG200, pH 6, VAPOR DIFFUSION, HANGING DROP, temperature 281K |