3EQP
Crystal Structure of Ack1 with compound T95
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | ALS BEAMLINE 5.0.2 |
| Synchrotron site | ALS |
| Beamline | 5.0.2 |
| Detector technology | CCD |
| Collection date | 2004-09-15 |
| Wavelength(s) | 1.0 |
| Spacegroup name | P 1 21 1 |
| Unit cell lengths | 70.996, 43.114, 92.848 |
| Unit cell angles | 90.00, 99.87, 90.00 |
Refinement procedure
| Resolution | 60.860 - 2.300 |
| R-factor | 0.224 |
| Rwork | 0.221 |
| R-free | 0.28400 |
| RMSD bond length | 0.012 |
| RMSD bond angle | 1.529 |
| Refinement software | REFMAC (5.5.0044) |
Data quality characteristics
| Overall | Outer shell | |
| Low resolution limit [Å] | 91.290 | 2.420 |
| High resolution limit [Å] | 2.300 | 2.300 |
| Number of reflections | 23616 | |
| <I/σ(I)> | 6.2 | 1.5 |
| Completeness [%] | 94.9 | |
| Redundancy | 3.5 | 3.5 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION | 298 | vapor diffusion, temperature 298K |
