3E6D
Crystal Structure of CprK C200S
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | ESRF BEAMLINE ID14-2 |
| Synchrotron site | ESRF |
| Beamline | ID14-2 |
| Spacegroup name | P 21 21 21 |
| Unit cell lengths | 42.950, 86.820, 124.410 |
| Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
| Resolution | 35.599 - 2.000 |
| R-factor | 0.233 |
| Rwork | 0.231 |
| R-free | 0.28000 |
| RMSD bond length | 0.004 |
| RMSD bond angle | 0.788 |
| Refinement software | PHENIX |
Data quality characteristics
| Overall | |
| Low resolution limit [Å] | 35.599 |
| High resolution limit [Å] | 2.000 |
| Number of reflections | 27656 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION, SITTING DROP | 6 | 294 | 100mM MES, 10% MPD, pH 6, VAPOR DIFFUSION, SITTING DROP, temperature 294K |
