342D
STRUCTURAL PARAMETERS FROM SINGLE-CRYSTAL STRUCTURES FOR ACCURATE MODELS OF A-DNA
Experimental procedure
| Temperature [K] | 298 |
| Detector technology | AREA DETECTOR |
| Collection date | 1996-06-25 |
| Detector | SIEMENS HI-STAR |
| Spacegroup name | P 43 21 2 |
| Unit cell lengths | 43.480, 43.480, 25.000 |
| Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
| Resolution | 8.000 - 2.100 |
| R-factor | 0.189 |
| Rwork | 0.189 |
| Structure solution method | MOLECULAR REPLACEMENT |
| RMSD bond length | 0.015 |
| RMSD bond angle | 1.480 |
| Data reduction software | SAINT |
| Data scaling software | SAINT |
| Phasing software | X-PLOR |
| Refinement software | XTALVIEW |
Data quality characteristics
| Overall | |
| Low resolution limit [Å] | 12.100 |
| High resolution limit [Å] | 1.850 |
| Rmerge | 0.048 |
| Number of reflections | 2153 |
| Completeness [%] | 77.0 |
| Redundancy | 2.5 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION | 7 | pH 7.00, VAPOR DIFFUSION |
Crystallization Reagents
| ID | crystal ID | solution ID | reagent name | concentration | details |
| 1 | 1 | 1 | WATER |
