2ZPL
Crystal structure analysis of PDZ domain A
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | PHOTON FACTORY BEAMLINE BL-5A |
Synchrotron site | Photon Factory |
Beamline | BL-5A |
Temperature [K] | 100 |
Detector technology | CCD |
Detector | ADSC QUANTUM 315 |
Wavelength(s) | 0.9791 |
Spacegroup name | P 31 |
Unit cell lengths | 54.756, 54.756, 75.644 |
Unit cell angles | 90.00, 90.00, 120.00 |
Refinement procedure
Resolution | 18.550 - 1.700 |
R-factor | 0.15075 |
Rwork | 0.150 |
R-free | 0.17550 |
Structure solution method | SAD |
RMSD bond length | 0.019 |
RMSD bond angle | 1.869 |
Data reduction software | HKL-2000 |
Data scaling software | and (SCALA) |
Phasing software | SHELXCD |
Refinement software | REFMAC (5.5.0035) |
Data quality characteristics
Overall | Outer shell | |
Low resolution limit [Å] | 18.550 | 1.790 |
High resolution limit [Å] | 1.700 | 1.700 |
Rmerge | 0.037 | 0.376 |
Number of reflections | 27607 | |
<I/σ(I)> | 35.1 | 4.2 |
Completeness [%] | 99.0 | 93.9 |
Redundancy | 10.8 | 7.8 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | VAPOR DIFFUSION | 8.5 | 293 | 17% PEG2000mme, 85mM Tris-HCl, 8.5mM NiCl2, VAPOR DIFFUSION, temperature 293K |