2XRN
Crystal structure of TtgV
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | DIAMOND BEAMLINE I04 |
| Synchrotron site | Diamond |
| Beamline | I04 |
| Temperature [K] | 100 |
| Detector technology | CCD |
| Detector | ADSC CCD |
| Spacegroup name | C 1 2 1 |
| Unit cell lengths | 70.862, 116.184, 71.881 |
| Unit cell angles | 90.00, 104.34, 90.00 |
Refinement procedure
| Resolution | 44.609 - 2.900 |
| R-factor | 0.2156 |
| Rwork | 0.212 |
| R-free | 0.27900 |
| Structure solution method | MOLECULAR REPLACEMENT |
| RMSD bond length | 0.005 |
| RMSD bond angle | 0.986 |
| Data reduction software | MOSFLM |
| Phasing software | PHASER |
| Refinement software | PHENIX ((PHENIX.REFINE)) |
Data quality characteristics
| Overall | |
| Low resolution limit [Å] | 69.000 |
| High resolution limit [Å] | 2.900 |
| Rmerge | 0.080 |
| Number of reflections | 12547 |
| Completeness [%] | 99.7 |
| Redundancy | 3.5 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 |






