2XIU
High resolution structure of MTSL-tagged CylR2.
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | SLS BEAMLINE X10SA |
Synchrotron site | SLS |
Beamline | X10SA |
Temperature [K] | 100 |
Detector technology | PIXEL |
Collection date | 2009-06-03 |
Detector | DECTRIS PILATUS 6M |
Spacegroup name | P 41 |
Unit cell lengths | 63.353, 63.353, 40.972 |
Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
Resolution | 44.800 - 1.500 |
R-factor | 0.1415 |
R-free | 0.19670 |
Structure solution method | MOLECULAR REPLACEMENT |
Starting model (for MR) | 1utx |
RMSD bond length | 0.009 |
RMSD bond angle | 0.028 |
Data reduction software | XDS |
Data scaling software | SADABS |
Phasing software | PHASER |
Refinement software | SHELXL-97 |
Data quality characteristics
Overall | Outer shell | |
Low resolution limit [Å] | 44.800 | 1.600 |
High resolution limit [Å] | 1.500 | 1.500 |
Rmerge | 0.040 | 0.170 |
Number of reflections | 25981 | |
<I/σ(I)> | 31.77 | 10.01 |
Completeness [%] | 99.0 | 98 |
Redundancy | 8.07 | 7.38 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | VAPOR DIFFUSION | 7 | VAPOUR DIFFUSION 50MM HEPES PH 7.0, 0.2M NACL |