2R91
Crystal Structure of KD(P)GA from T.tenax
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | SLS BEAMLINE X10SA |
Synchrotron site | SLS |
Beamline | X10SA |
Temperature [K] | 100 |
Detector technology | CCD |
Collection date | 2005-04-20 |
Detector | MARMOSAIC 225 mm CCD |
Wavelength(s) | 0.905 |
Spacegroup name | P 43 21 2 |
Unit cell lengths | 150.347, 150.347, 175.420 |
Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
Resolution | 48.170 - 2.000 |
R-factor | 0.186 |
Rwork | 0.184 |
R-free | 0.21300 |
RMSD bond length | 0.016 |
RMSD bond angle | 1.472 |
Data reduction software | XDS |
Data scaling software | XSCALE |
Phasing software | PHASER |
Refinement software | REFMAC (5.2.0019) |
Data quality characteristics
Overall | Outer shell | |
Low resolution limit [Å] | 48.170 | 2.100 |
High resolution limit [Å] | 2.000 | 2.000 |
Rmerge | 0.065 | 0.250 |
Number of reflections | 135046 | |
<I/σ(I)> | 5.92 | |
Completeness [%] | 100 | |
Redundancy | 9.9 | 10 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | VAPOR DIFFUSION | 7 | 298 | HEPES/KOH, pH 7.0, VAPOR DIFFUSION, temperature 298K |