2QXV

Structural basis of EZH2 recognition by EED

Experimental procedure

Experimental method	SINGLE WAVELENGTH
Source type	SYNCHROTRON
Source details	BSRF BEAMLINE 3W1A
Synchrotron site	BSRF
Beamline	3W1A
Temperature [K]	100
Detector technology	CCD
Collection date	2005-01-07
Detector	MAR CCD 165 mm
Wavelength(s)	1.10
Spacegroup name	P 21 21 21
Unit cell lengths	50.110, 52.740, 127.740
Unit cell angles	90.00, 90.00, 90.00

Refinement procedure

Resolution	20.000 - 1.820
Rwork	0.185
R-free	0.21800
Structure solution method	MAD
RMSD bond length	0.006
RMSD bond angle	1.390
Data reduction software	DENZO
Data scaling software	SCALEPACK
Phasing software	SOLVE
Refinement software	CNS (1.1)

Data quality characteristics

	Overall	Outer shell
Low resolution limit [Å]	99.000	1.890
High resolution limit [Å]	1.820	1.820
Number of reflections	30809
<I/σ(I)>	35.2
Completeness [%]	99.0	98.7
Redundancy	6.8

Crystallization Conditions

crystal ID	method	pH	temperature	details
1	VAPOR DIFFUSION, HANGING DROP	7.5	298	20% PEG MME 2000, 0.2M NaCl, 100mM HEPES, pH 7.5, VAPOR DIFFUSION, HANGING DROP, temperature 298.0K
1	VAPOR DIFFUSION, HANGING DROP	7.5	298	20% PEG MME 2000, 0.2M NaCl, 100mM HEPES, pH 7.5, VAPOR DIFFUSION, HANGING DROP, temperature 298.0K