2HKV
CRYSTAL STRUCTURE OF A PUTATIVE MEMBER OF THE DINB FAMILY (EXIG_1237) FROM EXIGUOBACTERIUM SIBIRICUM 255-15 AT 1.70 A RESOLUTION
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | SSRL BEAMLINE BL9-2 |
| Synchrotron site | SSRL |
| Beamline | BL9-2 |
| Temperature [K] | 100 |
| Detector technology | CCD |
| Collection date | 2006-06-17 |
| Detector | MARMOSAIC 325 mm CCD |
| Wavelength(s) | 0.97925 |
| Spacegroup name | P 32 2 1 |
| Unit cell lengths | 45.020, 45.020, 131.180 |
| Unit cell angles | 90.00, 90.00, 120.00 |
Refinement procedure
| Resolution | 25.094 - 1.700 |
| R-factor | 0.18514 |
| Rwork | 0.181 |
| R-free | 0.22700 |
| Structure solution method | MAD |
| RMSD bond length | 0.018 |
| RMSD bond angle | 1.451 |
| Data scaling software | XSCALE |
| Phasing software | SOLVE |
| Refinement software | REFMAC (5.2.0019) |
Data quality characteristics
| Overall | Inner shell | Outer shell | |
| Low resolution limit [Å] | 25.094 | 25.100 | 1.760 |
| High resolution limit [Å] | 1.700 | 2.900 | 1.700 |
| Rmerge | 0.115 | 0.115 | 0.970 |
| Number of reflections | 17704 | ||
| <I/σ(I)> | 9.58 | 17 | 1.99 |
| Completeness [%] | 99.8 | 100 | 99.8 |
| Redundancy | 9.38 | 7.01 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION,SITTING DROP,NANODROP | 277 | 20.0% PEG-3350, 0.2M MgSO4,, VAPOR DIFFUSION,SITTING DROP,NANODROP, temperature 277K | |
| 2 | VAPOR DIFFUSION,SITTING DROP,NANODROP | 293 | 20.0% PEG-3350, 0.2M MgSO4,, VAPOR DIFFUSION,SITTING DROP,NANODROP, temperature 293K |






