2AVP
Crystal structure of an 8 repeat consensus TPR superhelix
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | NSLS BEAMLINE X6A |
| Synchrotron site | NSLS |
| Beamline | X6A |
| Temperature [K] | 100 |
| Detector technology | CCD |
| Collection date | 2004-08-06 |
| Detector | ADSC QUANTUM 4 |
| Wavelength(s) | 1.60 |
| Spacegroup name | P 41 21 2 |
| Unit cell lengths | 54.245, 54.245, 71.782 |
| Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
| Resolution | 29.900 - 2.040 |
| R-factor | 0.205 |
| Rwork | 0.201 |
| R-free | 0.24100 |
| Structure solution method | SAD |
| RMSD bond length | 0.027 |
| RMSD bond angle | 2.026 |
| Data reduction software | HKL-2000 |
| Data scaling software | SCALEPACK |
| Phasing software | RESOLVE (2.02) |
| Refinement software | REFMAC (5.1.24) |
Data quality characteristics
| Overall | Outer shell | |
| Low resolution limit [Å] | 29.900 | 2.110 |
| High resolution limit [Å] | 2.040 | 2.040 |
| Number of reflections | 12784 | |
| <I/σ(I)> | 7.7 | |
| Completeness [%] | 97.8 | 94.1 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION | 5 | 295 | MPD, CdCl2, NaAcetate, NaCl, pH 5.0, VAPOR DIFFUSION, temperature 295K |
