2AVP

Crystal structure of an 8 repeat consensus TPR superhelix

Experimental procedure

Experimental method	SINGLE WAVELENGTH
Source type	SYNCHROTRON
Source details	NSLS BEAMLINE X6A
Synchrotron site	NSLS
Beamline	X6A
Temperature [K]	100
Detector technology	CCD
Collection date	2004-08-06
Detector	ADSC QUANTUM 4
Wavelength(s)	1.60
Spacegroup name	P 41 21 2
Unit cell lengths	54.245, 54.245, 71.782
Unit cell angles	90.00, 90.00, 90.00

Refinement procedure

Resolution	29.900 - 2.040
R-factor	0.205
Rwork	0.201
R-free	0.24100
Structure solution method	SAD
RMSD bond length	0.027
RMSD bond angle	2.026
Data reduction software	HKL-2000
Data scaling software	SCALEPACK
Phasing software	RESOLVE (2.02)
Refinement software	REFMAC (5.1.24)

Data quality characteristics

	Overall	Outer shell
Low resolution limit [Å]	29.900	2.110
High resolution limit [Å]	2.040	2.040
Number of reflections	12784
<I/σ(I)>		7.7
Completeness [%]	97.8	94.1

Crystallization Conditions

crystal ID	method	pH	temperature	details
1	VAPOR DIFFUSION	5	295	MPD, CdCl2, NaAcetate, NaCl, pH 5.0, VAPOR DIFFUSION, temperature 295K