1WAK
X-ray structure of SRPK1
Experimental procedure
| Experimental method | MAD |
| Source type | SYNCHROTRON |
| Source details | APS BEAMLINE 19-ID |
| Synchrotron site | APS |
| Beamline | 19-ID |
| Temperature [K] | 105 |
| Detector technology | CCD |
| Collection date | 2003-11-22 |
| Detector | ADSC CCD |
| Spacegroup name | P 65 2 2 |
| Unit cell lengths | 75.113, 75.113, 313.330 |
| Unit cell angles | 90.00, 90.00, 120.00 |
Refinement procedure
| Resolution | 19.520 - 1.730 |
| R-factor | 0.198 |
| Rwork | 0.198 |
| R-free | 0.21800 |
| Structure solution method | MAD |
| RMSD bond length | 0.010 |
| RMSD bond angle | 1.400 |
| Data reduction software | HKL-2000 |
| Data scaling software | HKL-2000 |
| Phasing software | CNS |
| Refinement software | CNS (1.0) |
Data quality characteristics
| Overall | Outer shell | |
| Low resolution limit [Å] | 30.000 | 1.820 |
| High resolution limit [Å] | 1.730 | 1.730 |
| Rmerge | 0.079 | 0.580 |
| Number of reflections | 562787 | |
| <I/σ(I)> | 11.5 | 5.87 |
| Completeness [%] | 99.5 | 99.9 |
| Redundancy | 10 | 11 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | 5.6 | 100 MM SODIUM CITRATE(PH5.6), 200 MM AMMONIUM ACETATE, 15%PEG 3350, pH 5.60 |
