1JOV
Crystal Structure Analysis of HI1317
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | APS BEAMLINE 17-ID |
| Synchrotron site | APS |
| Beamline | 17-ID |
| Temperature [K] | 115 |
| Detector technology | CCD |
| Detector | BRUKER |
| Spacegroup name | C 1 2 1 |
| Unit cell lengths | 80.540, 38.860, 92.360 |
| Unit cell angles | 90.00, 110.16, 90.00 |
Refinement procedure
| Resolution | 15.000 - 1.570 |
| Rwork | 0.208 |
| R-free | 0.26000 |
| Data reduction software | HKL-2000 |
| Data scaling software | HKL-2000 |
| Refinement software | REFMAC |
Data quality characteristics
| Overall | Outer shell | |
| Low resolution limit [Å] | 15.000 | 1.610 |
| High resolution limit [Å] | 1.570 | 1.570 |
| Rmerge | 0.031 | 0.240 |
| Number of reflections | 33851 | |
| <I/σ(I)> | 13.4 | 3.1 |
| Completeness [%] | 94.3 | 81.7 |
| Redundancy | 6.6 | 4.2 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION, HANGING DROP | 8.5 | 30% 4K-PEG, 0.2M LiSO4, 0.1 M Tris pH 8.5 , VAPOR DIFFUSION, HANGING DROP |






