1JOV
Crystal Structure Analysis of HI1317
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | APS BEAMLINE 17-ID |
Synchrotron site | APS |
Beamline | 17-ID |
Temperature [K] | 115 |
Detector technology | CCD |
Detector | BRUKER |
Spacegroup name | C 1 2 1 |
Unit cell lengths | 80.540, 38.860, 92.360 |
Unit cell angles | 90.00, 110.16, 90.00 |
Refinement procedure
Resolution | 15.000 - 1.570 |
Rwork | 0.208 |
R-free | 0.26000 |
Data reduction software | HKL-2000 |
Data scaling software | HKL-2000 |
Refinement software | REFMAC |
Data quality characteristics
Overall | Outer shell | |
Low resolution limit [Å] | 15.000 | 1.610 |
High resolution limit [Å] | 1.570 | 1.570 |
Rmerge | 0.031 | 0.240 |
Number of reflections | 33851 | |
<I/σ(I)> | 13.4 | 3.1 |
Completeness [%] | 94.3 | 81.7 |
Redundancy | 6.6 | 4.2 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | VAPOR DIFFUSION, HANGING DROP | 8.5 | 30% 4K-PEG, 0.2M LiSO4, 0.1 M Tris pH 8.5 , VAPOR DIFFUSION, HANGING DROP |