14ZX

Crystal Structure of FtsZ with Z198194394

Experimental procedure

Experimental method	SINGLE WAVELENGTH
Source type	SYNCHROTRON
Source details	NSLS-II BEAMLINE 17-ID-1
Synchrotron site	NSLS-II
Beamline	17-ID-1
Temperature [K]	100
Detector technology	PIXEL
Collection date	2025-04-09
Detector	DECTRIS EIGER X 9M
Wavelength(s)	0.92
Spacegroup name	P 65
Unit cell lengths	88.276, 88.276, 178.168
Unit cell angles	90.00, 90.00, 120.00

Refinement procedure

Resolution	44.177 - 2.005
Rwork	0.188
R-free	0.22630
Structure solution method	MOLECULAR REPLACEMENT
RMSD bond length	0.008
RMSD bond angle	1.617
Data reduction software	autoPROC (1.0.5)
Data scaling software	Aimless
Phasing software	DIMPLE
Refinement software	REFMAC (5.8.0430)

Data quality characteristics

	Overall	Outer shell
Low resolution limit [Å]	44.138	2.040
High resolution limit [Å]	2.006	2.006
Rmerge	0.268	2.056
Rmeas	0.279	2.141
Rpim	0.077	0.595
Total number of observations	697472	33973
Number of reflections	52448	2608
<I/σ(I)>	8.5
Completeness [%]	100.0
Redundancy	13.3	13
CC(1/2)	0.993	0.337

Crystallization Conditions

crystal ID	method	pH	temperature	details
ftsz-955	VAPOR DIFFUSION, SITTING DROP	5	294	0.1 M ammonium sulfate, 15.6% (w/v) PEG 3350, 0.1 M Bis-Tris pH 5.0.