14ZP

Crystal Structure of FtsZ with Z62645406

Experimental procedure

Experimental method	SINGLE WAVELENGTH
Source type	SYNCHROTRON
Source details	NSLS-II BEAMLINE 17-ID-1
Synchrotron site	NSLS-II
Beamline	17-ID-1
Temperature [K]	100
Detector technology	PIXEL
Collection date	2025-04-10
Detector	DECTRIS EIGER X 9M
Wavelength(s)	0.920051
Spacegroup name	P 65
Unit cell lengths	87.958, 87.958, 177.165
Unit cell angles	90.00, 90.00, 120.00

Refinement procedure

Resolution	44.018 - 2.587
Rwork	0.172
R-free	0.24010
Structure solution method	MOLECULAR REPLACEMENT
RMSD bond length	0.007
RMSD bond angle	1.527
Data reduction software	autoPROC (1.0.5)
Data scaling software	Aimless
Phasing software	DIMPLE
Refinement software	REFMAC (5.8.0430)

Data quality characteristics

	Overall	Outer shell
Low resolution limit [Å]	43.979	2.632
High resolution limit [Å]	2.587	2.587
Rmerge	0.426	2.399
Rmeas	0.443	2.490
Rpim	0.120	0.662
Total number of observations	326690	16834
Number of reflections	24188	1199
<I/σ(I)>	6.2
Completeness [%]	100.0
Redundancy	13.5	14
CC(1/2)	0.987	0.339

Crystallization Conditions

crystal ID	method	pH	temperature	details
ftsz-871	VAPOR DIFFUSION, SITTING DROP	5	294	0.1 M ammonium sulfate, 15.6% (w/v) PEG 3350, 0.1 M Bis-Tris pH 5.0.