14ZN

Crystal Structure of FtsZ with Z68299550

Experimental procedure

Experimental method	SINGLE WAVELENGTH
Source type	SYNCHROTRON
Source details	NSLS-II BEAMLINE 17-ID-1
Synchrotron site	NSLS-II
Beamline	17-ID-1
Temperature [K]	100
Detector technology	PIXEL
Collection date	2025-04-10
Detector	DECTRIS EIGER X 9M
Wavelength(s)	0.920051
Spacegroup name	P 65
Unit cell lengths	87.756, 87.756, 176.363
Unit cell angles	90.00, 90.00, 120.00

Refinement procedure

Resolution	43.917 - 2.090
Rwork	0.177
R-free	0.22160
Structure solution method	MOLECULAR REPLACEMENT
RMSD bond length	0.007
RMSD bond angle	1.605
Data reduction software	autoPROC (1.0.5)
Data scaling software	Aimless
Phasing software	DIMPLE
Refinement software	REFMAC (5.8.0430)

Data quality characteristics

	Overall	Outer shell
Low resolution limit [Å]	43.878	2.126
High resolution limit [Å]	2.090	2.090
Rmerge	0.250	2.199
Rmeas	0.259	2.295
Rpim	0.070	0.652
Total number of observations	606879	27246
Number of reflections	45377	2243
<I/σ(I)>	9.3
Completeness [%]	100.0
Redundancy	13.4	12.1
CC(1/2)	0.996	0.329

Crystallization Conditions

crystal ID	method	pH	temperature	details
ftsz-785	VAPOR DIFFUSION, SITTING DROP	5	294	0.1 M ammonium sulfate, 15.6% (w/v) PEG 3350, 0.1 M Bis-Tris pH 5.0.